O.J. Gietelink, J. Ploeg, B. De Schutter, and M. Verhaegen, "VEHIL: Test facility for fault management testing of advanced driver assistance systems," Proceedings of the 10th ITS World Congress, Madrid, Spain, 13 pp., Nov. 2003. Paper 2693.
This paper presents the latest developments of the VEHIL facility, which aims to make the development process of intelligent vehicles safer, cheaper and more manageable. The main feature of VEHIL is that a complete intelligent vehicle can be tested in a hardware-in-the-loop simulation environment. The use of VEHIL will be illustrated by preliminary test results of a Pre-Crash System. Furthermore, a methodological approach will be presented for the validation of fault management systems for Advanced Driver Assistance Systems by fault injection in VEHIL.